Wafer Probing

LFoundry offers wafer parametric tests and wafer- function tests in its more than 1200 m² class 1000 clean rooms, equipped with state-of-the art probers and testers from Agilent, Advantest and Hitachi.

LFoundry testers can handle up to 72 DUT in parallel, up to 60 Volts and frequencies up to 140 MHz and temperatures from -40°C up to 150°C.

We have long experience in testing Smartcards, ASICs, Microcontrollers, Flash and DRAMs. Our probing line is specially equipped with security features such as video control, access-control and closed networks to satisfy customers’ request for safe testing of delicate products. These include Smartcards for applications such as mobile-networks, passports, health cards and banking.

KGD wafer mapping can be done by physical inking and/or electronic mapping.

• Parametric test with Agilent HP4062 and HP4071A tester
• Functional test with Advantest and Hitachi tester
• Highly parallel up to 72 DUT
• Voltage up to 60 V
• Frequency up to 140 MHz
• Temperature from -40°C up to 150°C
• Wafer baking up to 350°C
• Wafer mapping by physical inking and/or electronic mapping
• Visual inspection by experienced and qualified operators